Teradyne's UltraFLEXplus platform paired with Tokyo Electron's probing technology delivers known good device screening for advanced 2.5D/3D packages.

Teradyne, Inc. (NASDAQ:TER), a leading provider of automated test equipment and advanced robotics, today announced an integrated test cell solution supporting known good device (KGD) screening for devices used in AI and data center applications, developed in collaboration with Tokyo Electron (TEL™). The solution pairs Teradyne's UltraFLEXplus platform with TEL's Prexa™ SDP (Singulated Device Prober) to provide fabless designers, foundries, and OSATs a production-ready path to high-quality device screening at multiple points in the advanced packaging flow.